| Description: |
Automatically acquire TEM/STEM images, measure particle sizes and extract
the respective particle size distributions (PSD) of (nano)-materials. The AutoEM software also incorporates methods for elemental analyses of individual
particles using electron energy loss and energy dispersive X-ray spectroscopy (EELS/EDX) allowing the extraction
of element-specific PSDs. Additionally automated acquisition of energy-filtered images (EFTEM) is implemented in the AutoEM software, which can be
used, e.g., to derive thickness maps and, thus, to evaluate the thickness of individual (plate-like) particles.
Download from here:
https://doi.org/10.5281/zenodo.2636362
Publication:
AutoEM: a software for automated acquisition and analysis of nanoparticles
J Nanopart Res (2019) 21:122 |
