ZFE is one of the leading materials characterisation experts for the semiconductor industry. Relying on a profound experience in device and failure analysis in microelectronics, we focus on new characterisation methods mostly based on electron microscopy (SEM-EDX-WDX-EBSD, FIB-processing and STEM-EDX-EELS-EFTEM). We continuously provide services for leading semiconductor companies and co-operate with them via national and European research projects. Our surface and microanalytical methods are extremely critical in Device development Reducing development time by fast and site specific metrology Analysis of other designs for critical inside … Electronics and Semiconductor Devices weiterlesen