Methods

Materials Characterisation

Light microscopy and optical 3-D metrology
Surface characterisation (topography) with scanning electron microscopy (SEM) and atomic force microscopy (AFM)
Microanalysis using SEM and x-ray spectrometry (EDX & WDX)
Materials analysis with high resolution transmission electron microscopy (HR-TEM)
Elemental nanoanalysis with electron energy-loss spectrometry (EELS) and energy-filtering TEM (EFTEM)
Atomic resolution analysis of materials, nanoparticles et al. using the Austrian Scanning Transmission Electron Microscope (ASTEM)
Cryo-TEM for soft matter and biomaterials characterisation
Nanostructuring of materials and surfaces with focused-ion beam lab (FIB)
In-situ microscopy studies of dynamical processes in the environmental SEM (ESEM)
Chemical imaging with FT-infrared and Raman microscopy
Advanced 3-D micro- and nanotomography of devices and materials
Structure and crystallography of materials with x-ray diffraction (XRD), electron backscattered diffraction (EBSD) and electron diffraction (SAED and CBED)

State-of-the-art Specimen Preparation