Methods
Materials Characterisation
- Light microscopy and optical 3-D metrology
- Surface characterisation (topography) with scanning electron microscopy (SEM) and atomic force microscopy (AFM)
- Microanalysis using SEM and x-ray spectrometry (EDX & WDX)
- Materials analysis with high resolution transmission electron microscopy (HR-TEM)
- Elemental nanoanalysis with electron energy-loss spectrometry (EELS) and energy-filtering TEM (EFTEM)
- Atomic resolution analysis of materials, nanoparticles et al. using the Austrian Scanning Transmission Electron Microscope (ASTEM)
- Cryo-TEM for soft matter and biomaterials characterisation
- Nanostructuring of materials and surfaces with focused-ion beam lab (FIB)
- In situ microscopy studies of dynamical processes in the environmental SEM (ESEM)
- Chemical imaging with FT-infrared and Raman microscopy
- Advanced 3-D micro- and nanotomography of devices and materials
- Structure and crystallography of materials with x-ray diffraction (XRD), electron backscattered diffraction (EBSD) and electron diffraction (SAED and CBED)
State-of-the-art Specimen Preparation
- Broad Ion Beam Milling
- Metallography
- Ultramicrotomy
- Cryo-ultramicrotomy
- Focused-ion beam (FIB) for cross-section and thin film preparation
- Thin film preparation
- Ion-milling
- Electrolytical thinning
- Cross-section preparation