Large Area Mapping

How to detect defects within larger areas by means of elemental maps

In comparison to standard elemental maps the large area mapping function of our new high-end EDX-Detector Oxford X-Max (attached to our new Zeiss Sigma 300) enables the acquisition of large sample areas (up to several centimetres) within very short time frames. The significantly larger detector (80mm²) area and efficient as well as fast signal processing electronics are the basis for high resolution analyses of considerable size.

The size of elemental maps is of outmost importance when it comes to small artefacts that are partly concealed by matrix or components of unknown size inhomogenously distributed within the sample. Nontheless in comparison to standard elemental maps, there is no loss of additional infomation. For every single pixle the whole spectrum information is available so that later quantitative analyses of certain areas of interest are possible.

Elemental Map – Titan: 31,2 MPixel, image width 3,42 mm, Pixel size 460 nm, 20keV

The following example displays the results of a polished crosssection of a volcanic rock collected in Iceland (Búðir  beach) with a diameter of  3 cm.

 Magnesium Aluminium Calcium

First line: Elemental Map: 6,3 MPixel, image width 2,99 cm, Pixel size 10,8 µm, 20 keV
Second line: Elemental Map: 31,2 MPixel, image width 3,42 mm, Pixel size 460 nm, 20keV

Possible applications


The Graz Centre for Electron Microscopy (ZFE) wants to thank the “Bundesministerium für Digitalisierung und Wirtschaftsstandort“ (bmdw) and the Austrian Cooperative Research (ACR) for financial support (PN: SP2016-002-006).



Questions? Please do not hesitate to contact:
Dr. Johannes Rattenberger | +43 (0) 316 873-8339
Hartmuth Schröttner  | +43 (0) 316 873 8349



Interested in more application examples?


ACR-Newslwetter: Der Goliath der Elementverteilung (German)