Large Area Mapping

In comparison to standard elemental maps the large area mapping function of our new high-end EDX-Detector Oxford X-Max (attached to our new Zeiss Sigma 300) enables the acquisition of large sample areas (up to several centimetres) within very short time frames. The significantly larger detector (80mm²) area and efficient as well as fast signal processing electronics are the basis for high resolution analyses of considerable size. The size of elemental maps is of outmost importance when it comes to small artefacts that are partly concealed … Large Area Mapping weiterlesen