New System

All in one: SEM & Raman & EDX = RISE + EDX

The new microscope features a fully integrated fast confocal Raman microscopy capability within the SEM chamber without any sacrifice on SEM specifications, operating independently and allowing correlated imaging between SEM (BSE-SE), EDS and Raman for structural and chemical information without complicated manipulation of the sample.

RISE stands for Raman Imaging and Scanning Electron microscopy. The seamless combination of the two techniques offers a distinct advantage when investigating samples, improves ease-of-use and accelerates experimental workflow.

This combination is the first installation in central Europe. We have already generated fascinating images and data. Please find some examples!

Raman Mapping of a Multi-layer Polymers Film

Left: Raman map in an SEM image  indicating different polymeric layers of the peelfilm; right: low voltage image of part of the peelfilm (rectangle mark in left image) revealing the structure of the polymer layers.

Raman: Cement Powder Particle Analysis

The combination of the depth of focus and material contrast of the SEM (BSE) with the depth resolution and chemical sensitivity of the confocal Raman microscope makes this analysis of particles in a powder without any sample preparation possible.


EDXS: Large Area Mapping

 Si Cu C Ca


The Graz Centre for Electron Microscopy (ZFE) wants to thank the “Bundesministerium für Digitalisierung und Wirtschaftsstandort“ (bmdw) and the Austrian Cooperative Research (ACR) for financial support (PN: SP2016-002-006).


Questions? Please do not hesitate to contact:
Hartmuth Schröttner  | +43 (0) 316 873 8349
Dr. Johannes Rattenberger | +43 (0) 316 873-8339



Want to know more?

Zeiss Sigma 300 VP

Large Area Mapping