Methods

Over the last decades the field of electron microscopy has improved not only with respect to higher performance such as better resolution, but also establishment of new techniques. At FELMI-ZFE we participate in method development with both via academic research as well as cooperations with manufacturers of microscopes and analytical equipment. Light microscopy and optical 3-D metrology Surface characterisation (topography) with scanning electron microscopy (SEM) and atomic force microscopy (AFM) Microanalysis using SEM and x-ray spectrometry (EDX & WDX) Materials analysis with high resolution transmission … Methods weiterlesen