Over the last decades the field of electron microscopy has improved not only with respect to higher performance such as better resolution, but also establishment of new techniques. At FELMI-ZFE we participate in method development with both via academic research as well as cooperations with manufacturers of microscopes and analytical equipment. Light microscopy and optical 3-D metrology Surface characterisation (topography) with scanning electron microscopy (SEM) and atomic force microscopy (AFM) Microanalysis using SEM and x-ray spectrometry (EDX & WDX) Materials analysis with high resolution transmission … Methods weiterlesen