Preliminary Programme

1st Day:  Scanning Electron Microscopy

Morning
Basic (E)SEM (lecture): electron guns – lenses electron-specimen interaction, signals SEM-imaging (lecture): secondary and backscattered electrons – detectors  contrast formation (topographic and material)

Afternoon
Image recording (lab):  working distance, focus, astigmatism contamination,  damage


2nd Day:  X-ray Spectrometry

Morning
Specimen preparation (lecture)

Basic X-ray spectrometry (lecture):  information depth, inelastic scattering, applications X-ray Analysis (lecture):  detectors (wavelength – energy dispersive), artefacts qualitative – quantitative analysis – mapping

Afternoon
X-ray acquisition (lab):  beam energy, count rate, acquisition time  spectra – mapping acquisition


3rd Day:  Applications

Morning
Analysis of specimens from the participants (lab)

Afternoon
Additional methods by scanning electron microscopy (lecture):  EBSD, Variable pressure SEM, Dual beam (SEM-FIB) Alternative Analytical methods (lecture):  Transmission electron microscopy Vibrational spectroscopy