X-ray Diffraction

X-ray diffraction is widely used for crystallographic analysis to identify powders, thin films and crystals (e.g. minerals, inorganic compounds). Incident X-rays, in our case produced by a copper source, are diffracted into many specific directions when hitting the material. By measuring the angles and intensities of these diffracted beams, we are able to deduce the crystal structure, chemical bonding and various other information.

Siemens D5005











Heating stage HTK 1200 from Anton Paar ( <1200°C at area or nitrogen atmosphere or Vacuumcondition (10-3mbar))



Samples can be analysed in solid, powder, thin film and solution form.